GRACE ELECTRON

It can detect the glass transition temperature Tg, thermal expansion coefficient CTE, ash content and other properties of electronic circuit substrates.

Can provide tracking index CTI test, volume/surface resistivity analysis test, arc resistance test, voltage test, dielectric breakdown test, etc.

Can provide tensile test, three-point bending test, pull-off test, normal temperature/high temperature peel test, drop hammer impact test, etc.

Pre-treatment conditions that can meet various requirements
Can perform CAF test, HAST test, Q1000 test, etc.

Provide slicing, component topography measurement and leading three-dimensional topography characterization capabilities
Provide nano-level morphology observation and measurement and element composition analysis

Thermal conductivity analysis and test of metal substrate for LED

Can provide halogen content analysis test, ROHS analysis test, compound structure characterization and sheet moisture test

Can provide test for circuit board substrate
Can provide signal integrity test for circuit board